The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2013
Filed:
Sep. 05, 2008
Christoph Herrmann, Aachen, DE;
Christian Baeumer, Hergenrath, BE;
Roger Steadman Booker, Aachen, DE;
Guenter Zeitler, Aachen, DE;
Christoph Herrmann, Aachen, DE;
Christian Baeumer, Hergenrath, BE;
Roger Steadman Booker, Aachen, DE;
Guenter Zeitler, Aachen, DE;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
The invention relates to a radiation detector (), particularly for X-rays (X) and for γ-rays, which comprises a combination of (a) at least one primary conversion layer (-) with a low attenuation coefficient for the photons and (b) at least one secondary conversion layer () with a high attenuation coefficient for the photons. In preferred embodiments, the primary conversion layer (-) may be realized by a silicon layer coupled to associated energy-resolving counting electronics (-). The secondary conversion layer () may be realized for example by CZT or GOS coupled to energy-resolving counting electronics or integrating electronics. Using primary conversion layers with low stopping power allows to build a stacked radiation detector () for spectral CT in which the counting rates of the layers are limited to feasible values without requiring unrealistic thin layers.