The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2013
Filed:
Aug. 16, 2010
Jochen Franzen, Bremen, DE;
Claus Köster, Lilienthal, DE;
Jochen Franzen, Bremen, DE;
Claus Köster, Lilienthal, DE;
Bruker Daltonik GmbH, Bremen, DE;
Abstract
Charged droplets are guided along a defined path from a droplet source to a droplet sink. A focusing pseudopotential distribution generated by audio frequencies on electrodes of a guiding device guide the charged droplets from the droplet source to the droplet sink with low loss. The droplets can be driven along the droplet guide by a gas flow, an axial electric field or a combination of both. For example, charged droplets from a spray capillary of an electrospray ion source at atmospheric pressure may be introduced into the inlet capillary leading to the vacuum system of ion analyzers, a procedure similar to that used up to now in nanoelectrospraying, but with substantially higher flow rates. In the guiding device, the droplets can be manipulated in different ways, for example evaporated down to a desired size. The introduction of small droplets into gas-aspirating capillaries is of interest because it is possible to keep the droplets on axis by Bernoulli focusing and to guide them in large quantities and with low loss through the capillary. The ability to guide the droplets makes it also possible to install a segmented inlet capillary with intermediate pumping, which allows pumping capacity to be saved. Advantageously, the sensitivity of ion analyzers such as mass spectrometers or ion mobility spectrometers by at least one order of magnitude.