The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2013

Filed:

Feb. 02, 2011
Applicants:

Hidetoshi Kami, Shizuoka-ken, JP;

Kazuhiro Egawa, Shizuoka-ken, JP;

Yukio Fujiwara, Shizuoka-ken, JP;

Inventors:

Hidetoshi Kami, Shizuoka-ken, JP;

Kazuhiro Egawa, Shizuoka-ken, JP;

Yukio Fujiwara, Shizuoka-ken, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 5/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

An electrophotographic photoreceptor, including an electroconductive substrate; a photosensitive layer; a crosslinked surface layer comprising α-alumina and tin oxide, wherein a first one-dimensional data array obtained from measuring a concavo-convex shape of the surface of the photoreceptor is subjected to a wavelet conversion to be separated into 6 frequency components, the one-dimensional data array of the lowest frequency component is further thinned so as to have 1/40 data arrays to obtain a second one-dimensional data array, the second one-dimensional data array is further subjected to the wavelet conversion to be separated into additional 6 frequency components, and wherein when relationships between respective arithmetic average roughness (WRa) (y-axis) of the 12 frequency components and the frequency components (x-axis) are graphed, at least WRa (214 to 551 μm) and WRa (26 to 106 μm) have a folding point or a maximum point.


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