The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8511171 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 20, 2013

Filed:

May. 23, 2011
Applicants:

Sisira Kankanam Gamage, Palo Alto, CA (US);

Naresh Venkata Mantravadi, San Jose, CA (US);

Inventors:

Sisira Kankanam Gamage, Palo Alto, CA (US);

Naresh Venkata Mantravadi, San Jose, CA (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device for measuring environmental forces, and a method for fabricating the same, is disclosed that comprises a device wafer, the device wafer comprising a first device layer separated from a second device layer by a first insulation layer. The first device wafer is bonded to an etched substrate wafer to create a suspended diaphragm and boss, the flexure of which is determined by an embedded sensing element.


Find Patent Forward Citations

Gamage, Sisira. (2013). Device for measuring environmental forces and method of fabricating the same (U.S. Patent No. 8511171). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8511171

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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