The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2013
Filed:
Apr. 25, 2011
Applicant:
Kyu-in Han, Suwon-si, KR;
Inventor:
Kyu-in Han, Suwon-si, KR;
Assignee:
SAMSUNG Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A computer system having a plurality of devices including a data storage part which includes a plurality of cells to store data, and a controller to inspect whether there is a defective cell in the data storage part if a condition to execute a cell inspection function is met, and sets the defective cell to be assigned to one of the devices if a defective cell is found.
Han, Kyu-in. (2013). Computer system inspecting defective cell and control method thereof (U.S. Patent No. 8510605). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8510605
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile