The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2013

Filed:

Jun. 02, 2011
Applicants:

Jacques Gollier, Painted Post, NY (US);

Garrett A. Piech, Horseheads, NY (US);

Michael B. Webb, Lindley, NY (US);

Qi Wu, Painted Post, NY (US);

Inventors:

Jacques Gollier, Painted Post, NY (US);

Garrett A. Piech, Horseheads, NY (US);

Michael B. Webb, Lindley, NY (US);

Qi Wu, Painted Post, NY (US);

Assignee:

Corning Incorporated, Corning, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03F 1/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical interrogation system is described herein that can interrogate a label-independent-detection (LID) biosensor and monitor a biological event on top of the biosensor without suffering from problematical parasitic reflections and/or problematical pixelation effects. In one embodiment, the optical interrogation system is capable of interrogating a biosensor and using an oversampling/smoothing algorithm to reduce oscillations in the estimated location of an optical resonance caused by the problematical pixelation effect which makes it easier to determine whether or not a biological event occurred on the biosensor.


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