The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2013
Filed:
Mar. 05, 2010
Toon Streppel, Eerbeek, NL;
Torsten Seehaus, Duesseldorf, DE;
Ulrich Schmitz, Kerken, DE;
Manfred Battefeld, Duesseldorf, DE;
Frank Thomas, Solingen, DE;
Michael Kussmann, Duesseldorf, DE;
Michael Haeck, Bergisch Gladbach, DE;
Toon Streppel, Eerbeek, NL;
Torsten Seehaus, Duesseldorf, DE;
Ulrich Schmitz, Kerken, DE;
Manfred Battefeld, Duesseldorf, DE;
Frank Thomas, Solingen, DE;
Michael Kussmann, Duesseldorf, DE;
Michael Haeck, Bergisch Gladbach, DE;
Hach Lange GmbH, Berlin, DE;
Abstract
A method for determining a condition indicator of a water analysis apparatus includes determining a respective parameter value for each of at least two different technical parameters of the water analysis apparatus. A respective deviation value of each of the parameter values is determined with respect to an associated respective parameter reference value for each of the technical parameters. A respective deviation relevance value from each of the deviation values is determined using a respective parameter-specific deviation relevance function for each of the parameter values, the parameter-specific deviation relevance functions being different from each other. Using an indicator function, a condition indicator is calculated from the determined deviation relevance values.