The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2013

Filed:

Dec. 01, 2006
Applicants:

Terrence L. Blevins, Round Rock, TX (US);

Wilhelm K. Wojsznis, Austin, TX (US);

Gregory K. Mcmillan, Austin, TX (US);

Peter Wojsznis, Cedar Park, TX (US);

Inventors:

Terrence L. Blevins, Round Rock, TX (US);

Wilhelm K. Wojsznis, Austin, TX (US);

Gregory K. McMillan, Austin, TX (US);

Peter Wojsznis, Cedar Park, TX (US);

Assignee:

Fisher-Rosemount Systems, Inc., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 11/01 (2006.01); G05B 13/02 (2006.01); G05B 19/42 (2006.01); G06F 11/30 (2006.01); G06F 11/00 (2006.01); G21C 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of diagnosing an adaptive process control loop includes measuring process control loop signal data, generating a plurality of process control loop parameters from the process loop signal data and evaluating a condition of the adaptive process control loop from one or more of the plurality of process control loop parameters. The process control loop data is generated as a result of a normal operation of one or more process control devices within the adaptive process control loop when the adaptive process control loop is connected on-line within a process control environment. A self-diagnostic process control loop includes a diagnostic tool adapted to receive a diagnostic index pertaining to a process control loop parameter for each component of the process control loop and for the complete process control loop. Each diagnostic index is generated from signal data by a corresponding index computation tool. The diagnostic tool is further adapted to evaluate a condition of the process control loop from one or more of the diagnostic indices.


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