The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2013
Filed:
Apr. 13, 2010
Reiko Fujino, Kawasaki, JP;
Reiko Fujino, Kawasaki, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
This invention enables parallelly sorting data in substantially M blocks though statistical information is updated. In the first scan conversion, () input transform coefficients of a two-dimensional array are read out and output in accordance with scan order information ScanOrder[ ], thereby outputting sorted one-dimensional array data. At this time, a significant coefficient detection unit determines whether the sorted data is a significant coefficient. Upon receiving a notification that the sorted data is a significant coefficient, a statistical information update unit updates statistical information ScanTotals[x] at a corresponding position. When the relationship between statistical information ScanTotals[x] and immediately preceding statistical information ScanTotals[x−1] is an ascending order, ScanOrder[x−1] and ScanOrder[x], and ScanTotals[x−1] and ScanTotals[x] are swapped respectively. A second scan conversion unit starts scan conversion of transform coefficients with a delay of at least two transform coefficients from a first scan conversion unit.