The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2013
Filed:
Nov. 09, 2009
Osamu Tsujii, Kawasaki, JP;
Makoto Sato, Tokyo, JP;
Masahiko Okunuki, Akiruno, JP;
Satoshi Shimizu, Boca Raton, FL (US);
Takashi Ogura, Tokyo, JP;
Osamu Tsujii, Kawasaki, JP;
Makoto Sato, Tokyo, JP;
Masahiko Okunuki, Akiruno, JP;
Satoshi Shimizu, Boca Raton, FL (US);
Takashi Ogura, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An X-ray imaging apparatus is provided with a multi X-ray source and a collimator in which a plurality of slits for X-rays to pass through are two-dimensionally formed, the size and position of the slits being adjustable. A control unit, as a first control mode, controls the size and position of the slits to move an examination region in parallel, when an X-ray source is changed to a different X-ray source, such that the examination directions are parallel before and after the change. Also, the control unit, as a second control mode, controls the size and position of the slits to rotate the examination direction, when an X-ray source is changed to a different X-ray source, such that the center of the examination regions is the same before and after the change.