The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2013
Filed:
Dec. 02, 2009
Gerald L. Fudge, Rockwall, TX (US);
Ross E. Bland, Dallas, TX (US);
Sujit Ravindran, Dallas, TX (US);
Mark A. Chivers, McKinney, TX (US);
Gerald L. Fudge, Rockwall, TX (US);
Ross E. Bland, Dallas, TX (US);
Sujit Ravindran, Dallas, TX (US);
Mark A. Chivers, McKinney, TX (US);
L—3 Communications Integrated Systems L.P., Greenville, TX (US);
Abstract
Improved spur reduction architectures that improve linearity in direct radio frequency (RF) receiver architectures. Non-uniform sampling in the form of sampling clock phase (or frequency) modulation is used to induce phase (or frequency) modulation on signals that are being received from a given Nyquist zone. At the output of the ADC (analog-to-digital converter), the signals are de-modulated to remove the induced modulation based on the Nyquist zone that is being received. The de-modulation process results in non-desired spurious artifacts (interfering leakage signals and ADC spurs) being spread in the frequency domain. Strong spurious artifacts may be removed after measuring the induced modulation and de-modulating. For the case of weak spurious artifacts, the de-modulation for the desired Nyquist zone spread these signals in the frequency domain. Induced modulation on signals may also provide a dithering effect on the ADC.