The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2013

Filed:

Dec. 16, 2010
Applicants:

Tomoyasu Takaoka, Osaka, JP;

Shigeru Furumiya, Hyogo, JP;

Atsushi Nakamura, Osaka, JP;

Inventors:

Tomoyasu Takaoka, Osaka, JP;

Shigeru Furumiya, Hyogo, JP;

Atsushi Nakamura, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/0045 (2006.01);
U.S. Cl.
CPC ...
Abstract

A recording wavelength generator selects control parameters of a recording pulse sequence, based on combinations of mark length, a first space length of a first space immediately before the mark, and a second space length of a second space immediately after the mark. A laser drive circuit records the marks by the recording pulse sequence. The first and second space lengths are classified into m and n types, respectively. An absolute value of a difference between two predetermined control parameters from among (m×n) control parameters selected during recording on a second information layer located on an incidence side of the laser beam with respect to a predetermined first information layer from among N information layers is equal to or greater than an absolute value of a difference between two predetermined control parameters from among the (m×n) control parameters selected during recording on the first information layer.


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