The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2013
Filed:
Apr. 28, 2011
Shigeharu Okano, Ishikawa, JP;
Nobuhisa Yamazaki, Ishikawa, JP;
Shigeharu Okano, Ishikawa, JP;
Nobuhisa Yamazaki, Ishikawa, JP;
PFU Limited, Ishikawa, JP;
Abstract
A friction-coefficient estimating device is configured to estimate friction coefficient of the surface of a medium in a form of a sheet by irradiating a light on the surface and by detecting specularly-reflected light component of a reflected light and a diffusely-reflected light intensity. The friction-coefficient estimating device comprises an irradiating unit including a first irradiating unit and a second irradiating unit, a specularly-reflected light receiving unit including a first specularly-reflected light receiving unit that receives a first specularly-reflected light component of a reflected light and detects a first specularly-reflected light intensity and a second specularly-reflected light receiving unit that receives a second specularly-reflected light component of a reflected light and detects a second specularly-reflected light intensity, and a diffusely-reflected light receiving unit that receives a diffusely-reflected light component of a reflected light and detects a diffusely-reflected light intensity, and a control unit that estimates a friction coefficient of the surface based on a first reflected-light intensity coefficient and a second reflected-light intensity coefficient.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile