The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2013

Filed:

Oct. 02, 2009
Applicant:

Tomoyuki Kamiyama, Wako, JP;

Inventor:

Tomoyuki Kamiyama, Wako, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A distance measuring system and a distance measuring method which use a time-of-flight (TOF) method. The distance measuring system obtains a reference light quantity of reflected light which is a cumulative light quantity of the reflected light during a reference period, obtains a measured light quantity of the reflected light which is a cumulative light quantity of the reflected light during a measurement period, and calculates, on the basis of a ratio of the measured light quantity of the reflected light to the reference light quantity of the reflected light and a ratio of the reflected light incident period to the reference period, a reflected light incident period that is a period which is included in the measurement period and during which the reflected light is incident upon photoelectric conversion elements of a light-receiving device. Then, the distance measuring system calculates the distance between the distance measuring system and an object on the basis of the reflected light incident period.


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