The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2013
Filed:
Feb. 05, 2010
Richard A. Sones, Cleveland Heights, OH (US);
Carl E. Sebeny, Cuyahoga Falls, OH (US);
Richard A. Sones, Cleveland Heights, OH (US);
Carl E. Sebeny, Cuyahoga Falls, OH (US);
Applied Vision Corporation, Cuyahoga Falls, OH (US);
Abstract
Systems and methods to estimate the height profile of an object using tomosynthesis-like techniques. A plurality of raw images of an object to be characterized are acquired, where the plurality of raw images are representative of a plurality of spatial shifts of an imaging device relative to the object to be characterized. The raw images are processed to generate composite images, where each composite image corresponds to a unique image shift between spatially adjacent raw images. A volatility parameter value is calculated within a neighborhood of a same image pixel location for each composite image. The composite image having the largest volatility parameter value for the image pixel location is determined. A unique image shift, corresponding to the composite image having the largest volatility parameter value, is transformed into a height value representative of a height dimension of the image pixel location.