The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2013

Filed:

May. 19, 2010
Applicants:

Musodiq Olatayo Bello, Niskayuna, NY (US);

Jens Rittscher, Ballston Lake, NY (US);

Bikash Chandra Mahato, Bangalore, IN;

Ahmad Yekta, Somerset, NJ (US);

Jilin Tu, Schenectady, NY (US);

Ying LI, New Brunswick, NJ (US);

Inventors:

Musodiq Olatayo Bello, Niskayuna, NY (US);

Jens Rittscher, Ballston Lake, NY (US);

Bikash Chandra Mahato, Bangalore, IN;

Ahmad Yekta, Somerset, NJ (US);

Jilin Tu, Schenectady, NY (US);

Ying Li, New Brunswick, NJ (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/47 (2006.01); G06K 9/00 (2006.01); G06K 9/46 (2006.01); G02B 17/00 (2006.01); G01N 23/00 (2006.01); A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is directed to method and system for image processing of test wells on a microplates wherein the microplates' test well wall boundaries are identified through the use of a candidate edge image wherein the candidate edge image represents locations of one or more segments of the wall boundaries.


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