The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2013
Filed:
Feb. 10, 2011
Applicant:
David P. Chengson, Aptos, CA (US);
Inventor:
David P. Chengson, Aptos, CA (US);
Assignee:
Juniper Networks, Inc., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/309 (2006.01);
U.S. Cl.
CPC ...
Abstract
A device provides a time domain reflectometry (TDR) or a vector network analyzer (VNA) test signal to a via test area provided on a printed circuit board (PCB), where the via test area includes vias and via stubs formed in the vias. The device also receives a reflected signal from each via in the via test area of the PCB, and compares the reflected signal from each via to a minimum impedance threshold. The device further provides, for display, an indication of passing for the PCB, when the reflected signals from the vias are greater than the minimum impedance threshold.