The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2013
Filed:
Feb. 03, 2011
Thorsten Feiweier, Poxdorf, DE;
Stefan Huwer, Erlangen, DE;
Tony Hyun Kim, Cambridge, MA (US);
David Andrew Porter, Poxdorf, DE;
Thorsten Speckner, Nuremberg, DE;
Thorsten Feiweier, Poxdorf, DE;
Stefan Huwer, Erlangen, DE;
Tony Hyun Kim, Cambridge, MA (US);
David Andrew Porter, Poxdorf, DE;
Thorsten Speckner, Nuremberg, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
In a method and magnetic resonance apparatus to reduce distortions in magnetic resonance diffusion imaging, a magnetic resonance data acquisition system is operated to acquire magnetic resonance data in a first measurement with a first diffusion weighting, and to acquire magnetic resonance data in a second measurement with a second, different diffusion weighting. A non-linear, system-specific distortion-correcting function is determined on the basis of system-specific information that is specific to said magnetic resonance data acquisition system. Correction parameters are calculated to correct distortions in subsequently-acquired diffusion-weighted magnetic resonance images, based on the data acquired in the first and second measurements with the system-specific distortion-correcting function applied thereto. The subsequently-acquired diffusion-weighted magnetic resonance images are corrected using the correction parameters to at least reduce distortions therein.