The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2013
Filed:
Mar. 25, 2010
Johannes Schneider, Karlsruhe, DE;
Peter Ullmann, Karlsruhe, DE;
Johannes Schneider, Karlsruhe, DE;
Peter Ullmann, Karlsruhe, DE;
Bruker BioSpin MRI GmbH, Ettlingen, DE;
Abstract
A method for obtaining amplitude and phase dependencies of radio frequency pulses, which are irradiated within the scope of a main magnetic resonance experiment for generating a predetermined n-dimensional spatial distribution (n>=1) of transverse magnetization in an object by means of at least one radio frequency transmitting antenna of a magnetic resonance measuring system in combination with spatially and temporally varying additional magnetic fields which are superimposed on the static and homogeneous base field of the magnetic resonance measuring system and change the transverse magnetization phase in the object in dependence on location and time is characterized in that, prior to performance of the main experiment, a preparational measurement is performed in which the change with time of the transverse magnetization phase in the object under the action of the additional magnetic fields is measured in a position-resolved fashion and the amplitude and phase dependencies of the radio frequency pulses for the main experiment are calculated on the basis of this change with time of the transverse magnetization phase, which is measured in a position-resolved fashion. In this fashion, experimental imperfections in the form of unintentional additional magnetic fields can be measured, taken into consideration and compensated for.