The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2013

Filed:

Jun. 14, 2012
Applicants:

Wenwu Wang, Beijing, CN;

Kai Han, Beijing, CN;

Shijie Chen, Beijing, CN;

Xiaolei Wang, Beijing, CN;

Dapeng Chen, Beijing, CN;

Inventors:

Wenwu Wang, Beijing, CN;

Kai Han, Beijing, CN;

Shijie Chen, Beijing, CN;

Xiaolei Wang, Beijing, CN;

Dapeng Chen, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/76 (2006.01); H01L 29/94 (2006.01); H01L 27/108 (2006.01); H01L 31/119 (2006.01); H01L 31/062 (2012.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor device is provided. A multi-component high-k interface layer containing elements of the substrate is formed from an ultra-thin high-k dielectric material in a single-layer structure of atoms by rapid annealing in the manufacturing of a CMOS transistor by the replacement gate process, and a high-k gate dielectric layer with a higher dielectric constant and a metal gate layer are formed thereon. The EOT of the device is effectively decreased, and the diffusion of atoms in the high-k gate dielectric layer from an upper level thereof is effectively prevented by the optimized high-k interface layer at high-temperature treatment.


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