The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2013

Filed:

Nov. 24, 2010
Applicants:

Jeffrey W. Nicholson, Warren, NJ (US);

Siddharth Ramachandran, Boston, MA (US);

Inventors:

Jeffrey W. Nicholson, Warren, NJ (US);

Siddharth Ramachandran, Boston, MA (US);

Assignee:

OFS Fitel, LLC, Norcross, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/58 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and systems are described using a non-linear optical system comprising a laser and a light delivery system comprising a single mode fiber, a mode converter, and a high order mode fiber, wherein the light delivery system that receives light from the source and provides a structured free-space beam having an embedded Gaussian beam. The light delivery system functions to illuminate a region of a sample and generate a non-linear response in a spatial region smaller than that associated with a Gaussian beam having a width comparable to the width of the embedded Gaussian beam. In another aspect, the light delivery system illuminates a region of a sample and generates a non-linear emission of radiation, is depicted. A further aspect of this embodiment includes an imaging assembly for detecting the non-linear emission and using a signal derived from the detected emission to generate a microscopic image of the sample.


Find Patent Forward Citations

Loading…