The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2013

Filed:

Oct. 27, 2011
Applicants:

Evren Asma, Niskayuna, NY (US);

Ravindra Mohan Manjeshwar, Glenville, NY (US);

Inventors:

Evren Asma, Niskayuna, NY (US);

Ravindra Mohan Manjeshwar, Glenville, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/166 (2006.01);
U.S. Cl.
CPC ...
Abstract

Nuclear imaging systems, non-transitory computer readable media and methods for adaptive imaging are presented. Particularly, the present method includes acquiring preliminary projection data by scanning each of one or more views of a subject for a determined preliminary scan interval. Further, a region of interest of the subject is identified. The preliminary projection data is then used to perform a constrained optimization of a rapidly computable image quality metric for determining an acquisition protocol that improves the image quality metric at the identified region of interest. Particularly, the determined acquisition protocol is used to acquire target projection data corresponding to at least the identified region of interest. Further, an image of at least the identified region of interest is reconstructed using the target projection data, the preliminary projection data, or a combination thereof.


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