The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2013

Filed:

Aug. 02, 2011
Applicants:

Daisuke Matsumoto, Kyoto, JP;

Yasunori Shiraki, Kyoto, JP;

Yusuke Nakayama, Kyoto, JP;

Genki Adachi, Kyoto, JP;

Inventors:

Daisuke Matsumoto, Kyoto, JP;

Yasunori Shiraki, Kyoto, JP;

Yusuke Nakayama, Kyoto, JP;

Genki Adachi, Kyoto, JP;

Assignee:

ARKRAY, Inc., Kyoto-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/453 (2006.01);
U.S. Cl.
CPC ...
Abstract

An analysis apparatus enables a plurality of analysis processes to be accurately and efficiently performed. The analysis apparatus includes a detention tank in which a specimen is stored, and a voltage applier. The voltage applier includes a power source and a contact tip to be brought into contact with the specimen for applying a voltage necessary for analyzing the specimen. The voltage applier renews the contact tip from a used state to an unused state after completing an analysis and before starting the subsequent analysis.


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