The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2013

Filed:

Sep. 29, 2010
Applicants:

Kyoji Takeichi, Gamagori, JP;

Ryoji Shibata, Toyokawa, JP;

Motoshi Tanaka, Gamagori, JP;

Katsuhiro Natsume, Toyohashi, JP;

Yuya Nakako, Toyota, JP;

Inventors:

Kyoji Takeichi, Gamagori, JP;

Ryoji Shibata, Toyokawa, JP;

Motoshi Tanaka, Gamagori, JP;

Katsuhiro Natsume, Toyohashi, JP;

Yuya Nakako, Toyota, JP;

Assignee:

Nidek Co., Ltd., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 49/00 (2012.01); B24B 51/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An eyeglass lens processing apparatus for processing a peripheral edge of an eyeglass lens, includes: a processing unit including a plurality of processing tools that process the peripheral edge of the eyeglass lens held by a lens chuck shaft; a calibrating lens; a mode selector that selects a calibration mode; a memory that stores calibration processing data for processing the calibrating lens to a predetermined shape; a detecting unit that includes a tracing stylus that contacts a surface of the calibrating lens which is processed by the processing unit based on the calibration processing data to detect the shape of the processed calibrating lens in the calibration mode; and a calculating unit that obtain calibration data by comparing a detected result by the detecting unit with the calibration processing data in the calibration mode.


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