The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2013
Filed:
Mar. 04, 2010
Enrique J. Fernández Martínez, Murcia, ES;
Pedro Prieto Corrales, Murcia, ES;
Pablo Artal Soriano, Murcia, ES;
Enrique J. Fernández Martínez, Murcia, ES;
Pedro Prieto Corrales, Murcia, ES;
Pablo Artal Soriano, Murcia, ES;
Voptica S.L., Murcia, ES;
Abstract
The invention relates to an ophthalmic instrument and method for measuring, controlling, and handling aberrations () of the eyes (), which further simultaneously provide visual stimulants when operating same. The instrument consists of a single device for correcting aberrations () as well as a single aberration sensor (), optically connected by an optical system (). A lighting system () introduces beams of light into both eyes. The measurement, control, and handling of the aberrations (), as well as the providing of visual stimulants (), are simultaneously and binocularly () carried out.