The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8505035 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 06, 2013

Filed:

May. 28, 2008
Applicant:

Andreas Ulrich, München, DE;

Inventor:

Andreas Ulrich, München, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is disclosed. In at least one embodiment, the method includes providing a system specification of the system; deriving a number Nof base patterns dependent on the system specification, a base pattern representing at least one service and having a number Nof parameterisable events and a parameterisable control section representing a control flow and/or a data flow between the events; selecting a number N, wherein NN, of base patterns and providing a control structure representing a control flow and/or a data flow between the selected base patterns dependent on an event trace expected as a result of the system run; and providing the reference data having at least the selected base patterns and the provided control structure.


Find Patent Forward Citations

Ulrich, Andreas. (2013). Method for providing reference data for a diagnosis of a system dependent on an event trace (U.S. Patent No. 8505035). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8505035

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