The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2013
Filed:
Sep. 17, 2010
Peng LI, Palo Alto, CA (US);
Masashi Shimanouchi, San Jose, CA (US);
Sergey Shumarayev, Los Altos Hills, CA (US);
Weiqi Ding, Fremont, CA (US);
Siriram Narayan, Pleasanton, CA (US);
Daniel Tun Lai Chow, Foster City, CA (US);
Mingde Pan, Morgan Hill, CA (US);
Peng Li, Palo Alto, CA (US);
Masashi Shimanouchi, San Jose, CA (US);
Sergey Shumarayev, Los Altos Hills, CA (US);
Weiqi Ding, Fremont, CA (US);
Siriram Narayan, Pleasanton, CA (US);
Daniel Tun Lai Chow, Foster City, CA (US);
Mingde Pan, Morgan Hill, CA (US);
Altera Corporation, San Jose, CA (US);
Abstract
An integrated circuit ('IC') includes circuitry for use in testing a serial data signal. One such IC includes circuitry for transmitting the serial data signal with optional jitter, optional noise, and/or controllably variable drive strength. One such IC also includes circuitry for receiving the serial data signal and performing a bit error rate ('BER') analysis in such a signal. Such an IC provides output signals indicative of results of its operations. One such IC operates in various modes to perform or at least emulate functions of an oscilloscope, a bit error rate tester, etc., for testing signals and circuitry with respect to jitter-tolerance, noise-tolerance, etc.