The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2013
Filed:
Apr. 30, 2010
Peter Mork, Rockville, MD (US);
Adriane Chapman, Arlington, VA (US);
Ken Samuel, McLean, VA (US);
Irina Vayndiner, Oak Hill, VA (US);
David Moore, Manassas, VA (US);
Peter Mork, Rockville, MD (US);
Adriane Chapman, Arlington, VA (US);
Ken Samuel, McLean, VA (US);
Irina Vayndiner, Oak Hill, VA (US);
David Moore, Manassas, VA (US);
The MITRE Corporation, McLean, VA (US);
Abstract
Methods, systems and computer program products for detecting anomalies for a database system are provided. A method may include extracting workload features from a query optimizer based on a query workload and generating feature models for the extracted workload features. The method may also include extracting instance features from the query optimizer based on a query instance. Instance feature values may be obtained. The method may further include applying a query instance to the workload feature models to produce a prediction value for each workload feature. Anomalies may be reported based on a comparison of each instance feature value with a corresponding prediction value. A system for detecting anomalies for a database system may include a query optimizer, a feature modeler and an anomaly detector.