The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2013
Filed:
Sep. 24, 2008
Applicant:
Malay Ganai, Plainsboro, NJ (US);
Inventor:
Malay Ganai, Plainsboro, NJ (US);
Assignee:
NEC Laboratories America, Inc., Princeton, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 9/445 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system and method for bounded model checking of computer programs includes decomposing a program having at least one reachable property node for bounded model checking (BMC) into sub-problems by employing a tunneling and slicing-based (TSR) BMC reduction method. The sub-problems of the TSR method are partitioned in a distributed environment, where the distributed environment includes at least one master processing unit and at least one client unit. The sub-problems are solved by each client independently of other clients to reduce communication overhead and provide scalability.