The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2013

Filed:

Jul. 08, 2009
Applicants:

Shunsuke Ariyoshi, Kobe, JP;

Toru Mizumoto, Kobe, JP;

Hiroo Tatsutani, Kobe, JP;

Inventors:

Shunsuke Ariyoshi, Kobe, JP;

Toru Mizumoto, Kobe, JP;

Hiroo Tatsutani, Kobe, JP;

Assignee:

Sysmex Corporation, Kobe, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is to present a sample analyzer comprising: an analysis result information generator for generating analysis result information including an analysis result of a sample; a display; a display controller for controlling the display so as to display the analysis result information generated by the analysis result information generator; an input receiver for receiving an input of a comment to one of the analysis result information; a memory for storing the comment received by the input receiver; and a determiner for determining whether another analysis result information to be displayed on the display meets with a predetermined condition, wherein the display controller controls the display so as to display the another analysis result information and the comment stored in the memory, when the determiner has determined that the another analysis result information meets with the predetermined condition.


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