The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2013
Filed:
Jul. 18, 2007
Brian Jeffrey Wenzel, San Jose, CA (US);
Dan E. Gutfinger, Irvine, CA (US);
Mihir Naware, San Jose, CA (US);
Xiaoyi Min, Thousand Oaks, CA (US);
Jeffery Siou, San Jose, CA (US);
Anders Bjorling, Solna, SE;
Dorin Panescu, San Jose, CA (US);
Brian Jeffrey Wenzel, San Jose, CA (US);
Dan E. Gutfinger, Irvine, CA (US);
Mihir Naware, San Jose, CA (US);
Xiaoyi Min, Thousand Oaks, CA (US);
Jeffery Siou, San Jose, CA (US);
Anders Bjorling, Solna, SE;
Dorin Panescu, San Jose, CA (US);
Pacesetter, Inc., Sunnyvale, CA (US);
Abstract
Techniques are provided for estimating left atrial pressure (LAP) or other cardiac performance parameters based on measured conduction delays. In particular, LAP is estimated based interventricular conduction delays. Predetermined conversion factors stored within the device are used to convert the various the conduction delays into LAP values or other appropriate cardiac performance parameters. The conversion factors may be, for example, slope and baseline values derived during an initial calibration procedure performed by an external system, such as an external programmer. In some examples, the slope and baseline values may be periodically re-calibrated by the implantable device itself. Techniques are also described for adaptively adjusting pacing parameters based on estimated LAP or other cardiac performance parameters. Still further, techniques are described for estimating conduction delays based on impedance or admittance values and for tracking heart failure therefrom.