The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2013
Filed:
Oct. 01, 2010
Yujie Zhu, Shanghai, CN;
Kunquan Sun, Shanghai, CN;
Yanbing Yu, Shanghai, CN;
Chao Wang, Shanghai, CN;
Kangzheng Wang, Shanghai, CN;
Yujie Zhu, Shanghai, CN;
Kunquan Sun, Shanghai, CN;
Yanbing Yu, Shanghai, CN;
Chao Wang, Shanghai, CN;
Kangzheng Wang, Shanghai, CN;
Murata Manufacturing Co., Ltd., Kyoto, JP;
Abstract
A method for testing characteristics of a communication device that includes a plurality of modules using a test fixture includes the steps of connecting the communication device to the test fixture, determining if tests to be performed on the plurality of modules can be simultaneously performed, performing the tests to be performed on the plurality of modules for any tests that are determined can be simultaneously performed, calculating a numerical value for each of the plurality of modules if it is determined that the tests to be performed cannot be simultaneously performed, selecting one of the tests based on the calculated numerical value, and performing the selected one of the tests based on the calculated numerical value and suspending the test or tests on the remaining modules of the plurality of modules other than the selected one of the tests.