The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2013
Filed:
Feb. 28, 2006
Nicola Dioguardi, Milan, IT;
Carlo Russo, Corsico, IT;
Fabio Grizzi, Milan, IT;
Barbara Franceschini, Pogliano Milanese, IT;
Nicola Dioguardi, Milan, IT;
Carlo Russo, Corsico, IT;
Fabio Grizzi, Milan, IT;
Barbara Franceschini, Pogliano Milanese, IT;
Humanitas Mirasole S.p.A., Rozzano, IT;
Abstract
The present invention relates to a method and an apparatus for processing and metrically quantifying images of objects containing clusters of points/spots, such as biological specimens comprising cluster of cells, in particular of human or animal origin, or images thereof. In particular, the present invention relates to a method for processing images of irregularly shaped objects in the form of at least one cluster of punctiform or spot-shaped objects, comprising a stage of acquisition of a digital image of said objects, a stage of image elaboration (IMA-EL) for quantizing said digital image to 1 bit and a stage of metrical processing of said 1-bit quantized image, wherein said stage of metrical processing comprises a stage of object's metrical quantification (QUANT) that on its turn comprises: -a stage of triangularization (TRIANG) for transforming the said at least one cluster of punctiform or spot-shaped objects into a grid of triangles wherein the apexes of the triangles correspond to the center of said punctiform or spot-shaped objects; -a stage of parameter calculation (PAR-CLC) for calculating at least one of the following parameters: -external perimeter of the said grid of triangles; -area (AC) of the said grid of triangles; -area (ACINF) of the said punctiform or spot-shaped objects inside the said grid of triangles; -area (APINF) of the isolated punctiform or spot-shaped objects outside the said at least one cluster; -density (DC) of the said punctiform or spot-shaped objects inside the said at least one cluster.