The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2013
Filed:
Jul. 14, 2011
Takashi Naruse, Osaka, JP;
Yasutaka Kawa, Osaka, JP;
Hayato Oba, Osaka, JP;
Keyence Corporation, Osaka, JP;
Abstract
Present invention is an image measurement device capable of easily identifying a degree of disagreement between contours for a plurality of workpieces, and including: an edge extraction unit that extracts an edge line from a workpiece image; an image comparison unit that compares the workpiece image with the previously held master image, an error calculation unit that calculates, based on the comparison result, an error indicating an amount of displacement between an edge position of the workpiece image and a position of the master image corresponding to this edge position; a statistical information calculation unit that calculates statistical information of the calculated error for a plurality of workpiece images and for each edge position; a statistical information display unit that displays the statistical information along the edge line extracted from the workpiece image or the master image in a display mode suitable for the values of the statistical information.