The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2013

Filed:

Jun. 18, 2012
Applicants:

Ryuji Fujii, Hong Kong, CN;

Quan Bao Wang, Hong Kong, CN;

Chun Fei Cheung, Hong Kong, CN;

Inventors:

Ryuji Fujii, Hong Kong, CN;

Quan Bao Wang, Hong Kong, CN;

Chun Fei Cheung, Hong Kong, CN;

Assignee:

SAE Magnetics (H.K.) Ltd., Hong Kong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 3/04 (2006.01); H01S 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for cooling a semiconductor light source bar during burn-in testing includes a fixture for holding the semiconductor light source bar, and the fixture including a housing having a water inlet channel and a water outlet channel communicated with the water inlet channel; a first water tank with coolant connected with the water inlet channel; a second water tank connected with the water outlet channel; and a pumping device at least connected with the water outlet channel for pumping the coolant from the first water tank to the second water tank, thereby rushing a bottom of the semiconductor light source bar to lower the temperature thereof. The system can disperse the local heat generated during burn-in testing and uniform the local temperature of the semiconductor light source bar, thereby maintaining a proper temperature during burn-in testing and improving the heat stability of the heat assist magnetic recording head.


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