The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2013

Filed:

Mar. 16, 2012
Applicants:

Yoshihisa Adachi, Kyoto, JP;

Shigemi Maeda, Yamatokoriyama, JP;

Atsushi Etoh, Tenri, JP;

Inventors:

Yoshihisa Adachi, Kyoto, JP;

Shigemi Maeda, Yamatokoriyama, JP;

Atsushi Etoh, Tenri, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A recording parameter setting device setting parameters of pulse sequences forming recording marks on recording media. The device includes a storage section storing first and second look-up tables, and a recording parameter setting section for obtaining from the tables and setting parameters corresponding to recording information. The pulse sequences form at least marks equal to or longer than a first predetermined length but not longer than a maximum mark length, and include top and last sections. Also, the first lookup table stores parameters for top sections that control heat of front edges of marks classified into a same group. The second lookup table stores parameters for last sections for controlling heat of rear edges that are equal to or longer than a second predetermined recording mark length, that is longer than the first predetermined recording mark length, through the maximum recording mark length and classified into a same group.


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