The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2013
Filed:
May. 10, 2011
Applicants:
Jeong-tae Hwang, Gyeonggi-do, KR;
Jeong-hun Lee, Gyeonggi-do, KR;
Inventors:
Jeong-Tae Hwang, Gyeonggi-do, KR;
Jeong-Hun Lee, Gyeonggi-do, KR;
Assignee:
Hynix Semiconductor Inc., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of testing a semiconductor memory device comprises receiving a clock, addresses, commands, and data from a test device through channels, generating an internal bank address in response to the addresses and the commands, performing a multi-bit parallel test for each of a plurality of banks based on the addresses, the commands, the data, and the internal bank address, and providing the test device with a test result signal.