The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2013
Filed:
Nov. 22, 2010
Kenji Hoshino, Saitama, JP;
Kenji Hoshino, Saitama, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
A cut-out process of image corresponding to an amount of optical axis deviation of left and right imaging optical systems is applied to left and right images acquired by the left and right imaging units to correct an optical axis deviation. In this case, the amount of optical axis deviation corresponding to a current focus position is acquired from the amounts of optical axis deviation detected in accordance with focus positions stored in advance in a storage unit (step S). A cut-out process of image for stereoscopic display is applied to the left and right images based on the acquired amount of optical axis deviation (step S). As a result, the optical axis deviation of the left and right imaging optical systems can be excellently corrected regardless of the focus position (subject distance).