The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2013
Filed:
Oct. 10, 2007
Applicants:
Adiseshu Nyshadham, Calgary, CA;
Ruska Patton, Calgary, CA;
Jason Jin, Calgary, CA;
Inventors:
Assignee:
Emscan Corporation, Calgary, Alberta, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
A near field microwave scanning system includes a switched array of antenna elements forming an array surface, a scan surface substantially parallel to the array surface and separated by a distance less than about 1 wavelength of the measured frequency, and a processing engine for obtaining and processing near field data, without the use of an absorber.
Nyshadham, Adiseshu. (2013). Multichannel absorberless near field measurement system (U.S. Patent No. 8502546). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8502546
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile