The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2013

Filed:

Mar. 31, 2010
Applicants:

Peng Lai, Foster City, CA (US);

Philip James Beatty, Redwood City, CA (US);

Anja Christina Sophie Brau, Menlo Park, CA (US);

Inventors:

Peng Lai, Foster City, CA (US);

Philip James Beatty, Redwood City, CA (US);

Anja Christina Sophie Brau, Menlo Park, CA (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/14 (2006.01); G01R 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, a method for processing magnetic resonance imaging data is provided. The method includes accessing the magnetic resonance imaging data, the data including a plurality of image data sets defining reconstructable images representative of a subject at different points in time. Each data set includes sampled data for sampled phase encoding points but is missing data for unsampled phase encoding points. An adaptive time window is determined for each image data set, and the missing data of at least one of the image data sets is determined based upon the sampled data for the respective data set and sampled data from at least one other data set within the time window for the respective data set.


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