The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2013
Filed:
Jun. 24, 2009
Applicants:
Stefan Assmann, Erlangen, DE;
Okan Ekinci, Uttenreuth, DE;
Inventors:
Stefan Assmann, Erlangen, DE;
Okan Ekinci, Uttenreuth, DE;
Assignee:
Siemens Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/543 (2006.01); G01R 33/56375 (2006.01); G01R 33/56383 (2006.01);
U.S. Cl.
CPC ...
Abstract
In a method and a magnetic resonance (MR) system for acquisition of MR data of a measurement subject in an MR examination in the magnetic resonance system, MR data of the measurement subject (are acquired according to measurement parameters while the measurement subject is moved relative to the magnetic resonance system, the acquired MR data are analyzed, and the measurement parameters are automatically adapted.
Assmann, Stefan. (2013). Magnetic resonance data acquisition system and method with recursively adapted object-specific measurement parameter adjustment during patient movement through the mri system (U.S. Patent No. 8502532). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8502532
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