The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2013

Filed:

Oct. 19, 2010
Applicants:

Sergey M. Shevchenko, Aurora, IL (US);

Michael J. Murcia, DeKalb, IL (US);

Inventors:

Sergey M. Shevchenko, Aurora, IL (US);

Michael J. Murcia, DeKalb, IL (US);

Assignee:

Nalco Company, Naperville, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D21H 23/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for monitoring with enhanced sensitivity of the deposition of one or more organic materials dispersed in an aqueous medium in a papermaking process which includes measuring the rate of deposition of the organic materials from the aqueous medium onto a quartz crystal microbalance having a top side contacting with the aqueous medium coated with a layer containing a material with surface energy in the range from about 34 to about 49 dynes/cm2, and a second, bottom side isolated from the aqueous medium is disclosed. Additionally, a method for measuring the effectiveness of an inhibitor that decreases the deposition of the organic materials in a papermaking process is also disclosed.


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