The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2013

Filed:

Aug. 25, 2011
Applicants:

Ronald J. Duke, Centerville, OH (US);

Brad Smith, Xenia, OH (US);

Thomas F. Powers, Webster, NY (US);

Morgan A. Smith, Rochester, NY (US);

Inventors:

Ronald J. Duke, Centerville, OH (US);

Brad Smith, Xenia, OH (US);

Thomas F. Powers, Webster, NY (US);

Morgan A. Smith, Rochester, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of determining a relative location of a first pattern and a second pattern includes providing a fiducial including a fiducial origin, a first camera, a second camera, and an image registration controller. A first fiducial image of the fiducial origin is captured using the first camera. A second fiducial image of the fiducial origin is captured using the second camera. A first pattern image of a first pattern is captured using the first camera. A second pattern image of a second pattern is captured using the second camera. A first location of the first pattern relative to the fiducial origin is determined using the image registration controller. A second location of the second pattern relative to the fiducial origin is determined using the image registration controller. A relative location of the first location and the second location is determined using the image registration controller.


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