The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2013

Filed:

Feb. 15, 2008
Applicants:

Malcolm W. Lockhart, Cary, NC (US);

Christopher J. Wysopal, Concord, MA (US);

Christopher J. Eng, Lexington, MA (US);

Matthew P. Moynahan, Gloucester, MA (US);

Simeon Simeonov, Lincoln, MA (US);

Inventors:

Malcolm W. Lockhart, Cary, NC (US);

Christopher J. Wysopal, Concord, MA (US);

Christopher J. Eng, Lexington, MA (US);

Matthew P. Moynahan, Gloucester, MA (US);

Simeon Simeonov, Lincoln, MA (US);

Assignee:

Veracode, Inc., Burlington, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Security assessment and vulnerability testing of software applications is performed based at least in part on application metadata in order to determine an appropriate assurance level and associated test plan that includes multiple types of analysis. Steps from each test are combined into a 'custom' or 'application-specific' workflow, and the results of each test may then be correlated with other results to identify potential vulnerabilities and/or faults.


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