The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2013
Filed:
Mar. 28, 2011
Wenzhong Liu, Wuhan, CN;
Jing Zhong, Wuhan, CN;
Yin LI, Wuhan, CN;
Zhongzhou Du, Wuhan, CN;
Di Xie, Wuhan, CN;
Wenzhong Liu, Wuhan, CN;
Jing Zhong, Wuhan, CN;
Yin Li, Wuhan, CN;
Zhongzhou Du, Wuhan, CN;
Di Xie, Wuhan, CN;
Abstract
The invention discloses a paramagnetism-based remote temperature measurement method for magnetic nanoparticles, and the method comprises: applying multiple times of excited magnetic fields on the area of a magnetic nano sample, constructing an equation group between the different excited magnetic fields and corresponding magnetic susceptibilities according to the Langevin's paramagnetic theorem, and obtaining the information of temperature and sample concentration via the equation group. The invention is capable of more precisely and more quickly detecting the temperature of an object, and especially applicable for the detection of thermal motion at bio-molecular level. Experiments indicate the measurement error is less than 0.56K.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile