The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2013
Filed:
Feb. 16, 2009
Mari Maruyama, Wako, JP;
Ushio Harada, Wako, JP;
Hiroshi Ichikawa, Wako, JP;
Honda Motor Co., Ltd., Tokyo, JP;
Abstract
A method of inspecting a stack body of at least a porous layer and a dense layer comprises the first step of measuring the length of the stack body before the stack body is fired, the second step of measuring the length of the stack body after the stack body is fired, the third step of calculating a shrinkage rate of the stack body based on a first measured value from the first step and a second measured value from the second step, the fourth step of determining whether the calculated shrinkage rate of the stack body is acceptable or not based on the calculated shrinkage rate, the fifth step of calculating an S/N ratio of the stack body based on the first measured value and the second measured value, and the sixth step of determining whether the current-voltage characteristics of the stack body are acceptable or not based on the calculated S/N ratio.