The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2013
Filed:
Dec. 01, 2010
Franz Fadler, Hetzles, DE;
Robert Fasbender, Erlangen, DE;
Armin Fürst, Erlangen, DE;
Burkhard Groh, Nürnberg, DE;
Reiner Franz Schulz, Dormitz, DE;
Kaiss Shanneik, Erlangen, DE;
Franz Fadler, Hetzles, DE;
Robert Fasbender, Erlangen, DE;
Armin Fürst, Erlangen, DE;
Burkhard Groh, Nürnberg, DE;
Reiner Franz Schulz, Dormitz, DE;
Kaiss Shanneik, Erlangen, DE;
Siemens Aktiengesellschaft, München, DE;
Abstract
An imaging apparatus for irradiating an object includes a source arrangement, from which x-rays from different positions that form an at least one-dimensional structure may be emitted. The imaging apparatus also includes a detector arrangement for detecting the x-rays. An object is positioned between the source arrangement and the detector arrangement so that, with the detector arrangement, the x-rays attenuated by the object are recorded. The imaging apparatus also includes an evaluation apparatus for evaluating the signals recorded by the detector arrangement. A region of the detector arrangement is assigned to different positions of the structure, from which x-rays are directed at the region in partial irradiations. The region is aligned relative to the structure, such that the partial irradiations that are produced from the different positions of the structure with a region of the detector develop a radiation geometry that irradiates the object in a planar fashion.