The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2013
Filed:
Jul. 07, 2011
Applicants:
Yasuhiro Kujirai, Tokyo, JP;
Koji Nakagiri, Kanagawa, JP;
Satoshi Nishikawa, Kanagawa, JP;
Yasuo Mori, Tokyo, JP;
Inventors:
Yasuhiro Kujirai, Tokyo, JP;
Koji Nakagiri, Kanagawa, JP;
Satoshi Nishikawa, Kanagawa, JP;
Yasuo Mori, Tokyo, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/12 (2006.01); G06K 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Defect-free printing is achieved by previewing on a display prior to printing, device functions and print specifications. Preview of double-sided faces is concurrently provided when double-sided printing is specified. Display is performed by generation of data which allows print preview that reflects consideration of device information and document data. Data is generated for perspective-reverse-face preview when page-specification information is set for double-sided faces.