The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8497993 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 30, 2013

Filed:

Aug. 08, 2010
Applicants:

Christophe Buisset, Le Bar sur Loup, FR;

Denis Simeoni, Le Rouret, FR;

Patrick Astruc, Mandelieu la Napoule, FR;

Cyril Degrelle, Mandelieu la Napoule, FR;

Inventors:

Christophe Buisset, Le Bar sur Loup, FR;

Denis Simeoni, Le Rouret, FR;

Patrick Astruc, Mandelieu la Napoule, FR;

Cyril Degrelle, Mandelieu la Napoule, FR;

Assignee:

Thales, Neuilly sur Seine, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

A static interferometer comprises an entrance pupil, a splitter plate, a first mirror and a second mirror which are arranged in such a way that light beams originating from a collimated source are divided on the splitter plate, reflect on each of the mirrors and recombine while interfering at the output of the interferometer. The interferometer comprises a prismatic plate of index n comprising a variable thickness e, the first beam passing through the prismatic plate before reflecting on a reflecting surface of the first mirror, the reflecting surface comprising a plurality of zones, each zone j being situated at a mean distance Δfrom a reference plane. The reference plane being perpendicular to an optical axis and corresponding to a position of a plane mirror for which the optical path difference between the two interfering reflected beams is zero, each thickness ebeing substantially equal to Δ·n/(n−1).


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