The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2013
Filed:
Nov. 11, 2009
Jingyong YE, Ann Arbor, MI (US);
Jason E. Gestwicki, Ann Arbor, MI (US);
Theodore B. Norris, Dexter, MI (US);
James R. Baker, Jr., Ann Arbor, MI (US);
Tommaso F. Bersano-begey, Ann Arbor, MI (US);
Jingyong Ye, Ann Arbor, MI (US);
Jason E. Gestwicki, Ann Arbor, MI (US);
Theodore B. Norris, Dexter, MI (US);
James R. Baker, Jr., Ann Arbor, MI (US);
Tommaso F. Bersano-Begey, Ann Arbor, MI (US);
The Regents of The University of Michigan, Ann Arbor, MI (US);
Abstract
A system for determining whether interaction occurs between a trial substance and a target substance. The system includes a photonic crystal sensor having a photonic crystal structure and a defect member disposed adjacent the photonic crystal structure. The defect member defines an operative surface able to receive the target substance and the trial substance. The system further includes a light source that inputs a light signal to the photonic crystal structure and the defect member. The light signal is internally reflected, and a resultant output signal is outputted. The output signal relates to whether the trial substance interacts with the target substance at the operative surface. Furthermore, the system includes an identity detector that identifies the trial substance that interacts with the target substance.